Instruments and Measurement Capabilities
JEOL JSM-820 SEM with Oxford eXL energy dispersive X-ray analyzer
- High resolution (4 nm) imaging of surfaces
- Nondestructive analysis of large samples (up to 8" x 8" x 1.5")
- Low voltage operation for analysis of insulating samples
- Quantitative chemical microanalysis with 0.1% detection limits if no spectral overlaps
- Extensive automated image analysis based on size, shape and chemical composition
- Images can be stored on computer disks as TIFF files printable on laser or ink jet printers
- NTSC port allows complete video documentation of SEM session
The JEOL SEM and Oxford eXL instrument was purchased by the Department of
Geological Sciences and The Ohio State University.
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